Measure the reflectivity of a minute area with a diameter ranging from 17 to 70 um
Optical Path of Reflectivity Measurement
Example of reflectivity measurement : lens
Example of reflectivity measurement : lens curvature
Film Thickness Measurement Screen-shot
Object Color Measurement Screen-shot
Display an XY chromaticity diagram, an L*a*b* chromaticity diagram, and their related numeric values based on reflectivity data.
Measure the transmittance of a plane sample by transmitting 2 mm parallel beams of lights through the sample to the spectrophotometry acceptance elements.
Optical Path of Transmittance Measurement
Measure the reflectivity at an incidence angle of 45 degrees by reflecting 2 mm parallel beams of lights to the spectrophotometry acceptance elements.
Optical Path of 45-degree Reflectivity Measurement
Quick, high repeatability measurements can be achieved in seconds using a flat field grating, line sensor and high-speed spectrophotometry.
Optical system image
Olympus has designed a new dedicated objective lens that provides non-contact measurements across an area of 17 to 70 ?m diameters. The new lens provides high repeatability on even curved surfaces or minute electronic parts.
Image of reflectivity measurment
Accurate measurement of surface reflectivity can be performed without the costly steps needed to prevent rear surface reflection. Rear surface-reflected light is reduced by means of special optics that block all out-of-focus light reflection similar to a confocal system. Whether your optical component is spherical,aspherical or flat, the USPM-RU-W does not require sample preparation through anti-reflection treatments.
Principle of backside reflection elimination
The single-layer or multi-layer film thickness can be analyzed according to the measured spectral reflectivity data. You can select the optimum measurement method for the application.
Peak valley film thickness analysis result
This method is used to calculate film thickness based on the periods between the peaks and valleys of the measured spectral reflectivity value, and is effective for measuring single-layer film. No complicated settings are required, so measuring film thickness is easy.
Fourier Transform Method
Fourier transform film thickness analysis result
This method is used to calculate film thickness based on the periods between measured spectral reflectivity values, and is effective for measuring single-layer and multilayer films. The Fourier transform method eliminates noise, thus making analysis possible when it is difficult to detect peak and valley values.
Curve Fit Method
Curve fitting film thickness analysis result
This method is used to calculate film thickness by estimating which structure has the smallest difference between the measured spectral reflectivity and the calculated reflectivity for that structure, and is effective for measuring single-layer and multilayer films. The curve fit method also makes it possible to analyze thin film in which peak and valley values are not apparent.
Satisfies Diverse Measurement Needs at High Speed and With High Precision
Evaluation of Lens Coating for reflectivity,color and film thickness.
Mobile Phone Camera Lenses
Digital Camera Lenses
Examining the Reflectivity and Film Thickness of Minute Electronic Parts.
Printed Circuit Boards
Reflectivity, Film Thickness and Transmittance measurment of Planar Optical Elements.
LCD color filters
Optical Elements Reflectivity at an Incident Angle of 45 Degrees.
|Reflectivity measurement||Transmittance Measurement*1||Reflectivity Measurement for 45-Degrees*1|
|Name||NIR Micro-Spectrophotometer||Transmittance measurement set for||45-degree reflectance measurement set for|
|NIR Micro-Spectrophotometer||NIR Micro-Spectrophotometer|
|Measured wavelength||380 to 1050 nm|
|Measurement method||Compared with a reference sample for measurement||Transmissivity is measured with 100% as standard||Compared with a reference sample for measurement|
|Measurement range||See the specifications of the objective lens below||Approx. 2.0 mm in diameter|
|Measurement repeatability(3?) *2||Reflectivity measurement||During use of 10x and 20x objective lenses||±0.02% or less (430 to 1010 nm)||±0.3% or less (430 to 1010 nm)|
|±0.2% or less (Except as described above)||±1.0% or less (Except as described above)|
|During use of a 40x objective lens||±0.05% or less (430 to 950 nm)|
|±0.5% or less (Except as described above)|
|Film thickness measurement||±1%?||-|
|Wavelength display resolution||1nm|
|Lighting accessory||Dedicated halogen light source, JC12V 55W (Average life: 700 hours)|
|Shift stage||Loading surface size: 200 (W) x 200 (D) mm|
|With stand load: 3 kg|
|Operating range: (XY) ±40 mm, (Z) 125 mm|
|Tilt stage||?||Loading surface size: 140 (W) x 140 (D) mm|
|Withstand load: 1 kg|
|Operating range: (XT) ±1*, (YT) ±1*|
|Weight||Main body: Approx. 26 kg (not including PC)||Main body: Approx. 31 kg (not including PC)*3|
|Control power box: Approx. 6.7 kg|
|Dimensions||Main body: 360 (W) x 446 (D) x 606 (H) mm||Main body: 360 (W) x 631 (D) x 606 (H) mm|
|Control power box: 250 (W) x 270 (D) x 125 (H) mm (Protruding parts are not included)|
|Power specifications||Input specifications: AC 100-240V (110V) 50/60Hz|
|Operating environment||Horizontal place not subject to vibration|
|Temperature: 15 ºC to 30 ºC|
|Humidity: 15% to 60% RH (Free from dew condensation)|
*1 Optional unit *2 Measured under the measurement conditions of our company. *3 The total weight of both the transmissivity measurement set and 45-degrees reflectivity measurement set installed is approx. 33 kg.
|Operating distance||±5 mm or more||±1 mm or more||±1 mm or more|
*4 It differs from objective lens NA.
*5 Spot diameter
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