Clear Observation Images with UIS2 Objective Lens

Thanks to Olympus’ sophisticated design and manufacturing technology, new ACHN-P and UPLFLN-P strain-free objectives reduce internal strain to an absolute minimum. Olympus has also totally redesigned its polarizers and polarizing condensers to further enhance performance in polarized light. This means a higher EF* value, resulting in unmatched image brightness and contrast.

*EF value: the ratio of brightness of parallel Nicols to orthogonal(Cross) Nicols. The higher is the EF value, the less is the strain of the optical system. This means that a higher EF value is superior in polarization characteristics.
Example Observation Images

Quartz Diorite

Liquid Crystal MBBA (P-methoxy Benzylidene P-n Butyl Aniline)




UPLFLN-P Series Specifications
Product Name Numerical Aperture
Working Distance
UPLFLN4XP 0.13 17.0mm
UPLFLN10XP 0.3 10.0mm
UPLFLN20XP 0.5 2.1mm
UPLFLN40XP 0.75 0.51mm
UPLFLN100XOP 1.3 0.2mm


ACHN-P Series


ACHN-P Series Specifications
Product Name Numerical Aperture
Working Distance
ACHN10xP 0.25 6.0mm
ACHN20xP 0.40 3.0mm
ACHN40xP 0.65 0.45mm
ACHN100xOP 1.25 0.13mm

Superior Operability and Optical Performance

Large Viewfields and Ergonomic Design

Observations can be performed comfortably and efficiently thanks to the Y-shape frame developed in pursuit of ultimate ergonomics. This greatly lessens operator’s fatigue during the extended observation.
The Field Number is as large as 22, allowing a 21% wider area than that given by a microscope of ordinary filed number 20 to be observed at a glance. In addition, a bright halogen lamp of 12V-100W is used in the illumination system allowing observation of clear images of polarization.

Rugged and Accurate Rotating Stage

The rotating-centering mechanism attached to the rotary stage allows smooth rotation of a specimen. In addition, there is a click-stop mechanism provided at each 45 degrees for precise measurement. With the option of adding a dual-mechanical stage further discreet x-y movement is possible.
Rotary Stage

Dual-mechanical Stage

Accessories Suited for High-level Polarization Observation



Six different compensators are available for the BX51-P microscope, allowing measurement of various retardation levels, ranging from 0 to 20λ. For easier measurement, the direct readout method is featured. Higher image contrast can be attained by using a Senarmont or Brace- Koehler compensator to change the retardation level in the entire field of view.

Retardation Measuring range of compensators
Compensator Measuring Range Major Application
U-CTB Thick Berek 0-11,000nm Large Retardation Measurement (R*>3λ), ( Crystal , Giant Molecule, Fiber, Photoelastic Strain, etc.)
U-CBE Berek 0-1,640nm Retardation Measurement ( Crystal , Giant Molecule, Fiber, Body Tissue, etc.)
U-CSE Senarmont 0-546nm Retardation Measurement ( Crystal , Body Tissue, etc.)
Contrast Intensification (Body Tissue, etc.)
U-CBR1 Brace-Kohler 1/10λ 0-55nm Minute Retardation Measurement ( Crystal , Body Tissue, etc.)
Contrast Intensification (Body Tissue, etc.)
U-CBR2 Brace-Kohler 1/30λ 0-20nm
U-CWE2 Quarts Wedge 500-2,200nm Preliminary Survey of Retardation ( Crystal , Giant Molecule, etc.)

* R stands for retardation.
The use of an interference filter 45IF546 together is recommended for improving measuring accuracy (Except for U-CWE2).

Unmatched image sharpness in orthoscopic and conoscopic observations.

Conoscopic Orthoscope Observation Units

With a U-CPA conoscopic observation attachment, changeover between orthoscopic and conoscopic observation is simple and quick.
Focusing of conoscopic images is easy and accurate. Employing a Bertrand field stop makes it possible to obtain consistently sharp and clear conoscopic images

Easy adaptation of digital cameras, image analysis software and automated accessories

Our full line of digital cameras provide viewing and speedy image transfer to computers. OLYMPUS Image Analysis Software has been designed specifically for industrial microscopy applications with intuitive menus and advanced software routines. Users are empowered with the latest image analysis and management solutions to satisfy specific application requirements.


Polarizing Microscope BX51-P Specifications
Optical System UIS2 Optical System (Infinity-corrected)
Microscope Frame Observation Method BF/KPO*/PO
Reflected/Transmitted Transmitted
Illumination System 100 W Halogen
Intermediate Attachment Changeover between Orthoscopic/ Conoscopic Observation Attachment or Detachment of Bertrand Lens
Bertrand Lens Capable of Focusing
Analyzer 360° Rotatable, Minimum Graduation 1° (Readout Down to 0.1° Possible by Using tde Vernier)
Focus Stroke 35 mm
Resolution/Fine Adjustment Sensitivity Fine Stroke per Rotation 0.1 mm
Revolving Nosepiece Centerable Quadruple for BF
Observation Tube Standard Field (Field Number 20) -
Widefield (Field Number 22) Trinocular Observation Tube
Stage Polarizing Rotatable Stage (with 45° Clip Stop)
Option Sensitive Tint Plate, Compensator
Dimensions Conoscope/Orthoscope Combined 317.5(W)x587(D)x464(H)mm
Orthoscope Combined 317.5(W)x587(D)x437(H)mm
Weight Conoscope/Orthoscope Combined 16.6 kg (in Standard Combination)
Orthoscope Combined 15.6 kg (in Standard Combination)
Remark *Simple Polarized Light Observation


The BX51P polarizing microscope is an investigative tool for the identification of isotropic and anisotropic materials, forensic analysis, thin film/polymer/crystal identification, and extraneous particulates